Title :
Simple Statistical Analysis Techniques to Determine Minimum Sense Amp Set Times
Author_Institution :
IBM, Essex
Abstract :
Simple statistical analysis techniques are described, involving a relatively small number of actual circuit simulations, to accurately determine the minimum required sense amp set time for memory designs. Techniques to generate and evaluate the statistical distributions for signal development, leakage and sense amp asymmetry are discussed with important implications to sense amp design.
Keywords :
SRAM chips; circuit simulation; memory architecture; statistical distributions; circuit simulations; memory designs; minimum sense amp set times; sense amp asymmetry; signal development; statistical analysis techniques; statistical distributions; Circuit simulation; Degradation; Multiplexing; Random access memory; Signal design; Signal generators; Stability; Statistical analysis; Statistical distributions; Switches;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405677