DocumentCode :
2413201
Title :
Simple Statistical Analysis Techniques to Determine Minimum Sense Amp Set Times
Author :
Houle, Robert
Author_Institution :
IBM, Essex
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
37
Lastpage :
40
Abstract :
Simple statistical analysis techniques are described, involving a relatively small number of actual circuit simulations, to accurately determine the minimum required sense amp set time for memory designs. Techniques to generate and evaluate the statistical distributions for signal development, leakage and sense amp asymmetry are discussed with important implications to sense amp design.
Keywords :
SRAM chips; circuit simulation; memory architecture; statistical distributions; circuit simulations; memory designs; minimum sense amp set times; sense amp asymmetry; signal development; statistical analysis techniques; statistical distributions; Circuit simulation; Degradation; Multiplexing; Random access memory; Signal design; Signal generators; Stability; Statistical analysis; Statistical distributions; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
Type :
conf
DOI :
10.1109/CICC.2007.4405677
Filename :
4405677
Link To Document :
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