DocumentCode :
2413236
Title :
Charge-Based Compact Modeling of Multiple-Gate MOSFET
Author :
Iñiguez, Benjamin ; Lazaro, Antonio ; El Hamid, H.A. ; Moldovan, Oana ; Nae, Bogdan ; Roig, Jaume ; Jiménez, David
Author_Institution :
Univ. Rovira i Virgili, Tarragona
fYear :
2007
fDate :
16-19 Sept. 2007
Firstpage :
49
Lastpage :
56
Abstract :
We present new compact modeling techniques which have been applied for different types of multiple-gate MOSFETs: double-gate MOSFETs, gate all around MOSFETs and FinFETs. Long channel models are obtained by deriving a unified charge control model from the solution the 1-D Poisson´s equation (considering volume inversion), and using it in an adequate transport model. The final channel current, charge and capacitance models are written in terms of the charge sheet densities at the source and drain ends of the channel. The short-channel effects can be easily incorporated to this unified model. Analytical and scalable models for the subthreshold swing, threshold voltage roll-off and DIBL have been developed by solving the 2-D or 3-D Poisson equation using appropriate techniques; these models are also based on a physical analysis of the conduction path. We observed a very good agreement with 2-D and 3-D numerical simulations of the characteristics of the different multiple-gate devices. Finally, using the active transmission line approach, we extended our compact models to the high frequency operation, in order to study the RF performance, including noise.
Keywords :
MOSFET; Poisson equation; semiconductor device models; semiconductor device noise; DIBL model; FinFET; Poisson equation; RF performance; active transmission line approach; adequate transport model; capacitance models; channel current model; charge model; charge-based compact modeling; double-gate MOSFET; gate all around MOSFET; long channel models; multiple-gate MOSFET; noise performance; short-channel effects; subthreshold swing models; threshold voltage roll-off model; unified charge control model; volume inversion; Active noise reduction; Analytical models; Capacitance; FinFETs; MOSFET circuits; Numerical simulation; Poisson equations; Radio frequency; Threshold voltage; Transmission lines; DIBL; Double Gate MOSFETs; FinFETs; Gate All Around MOSFETs; compact modeling; high frequency noise; multiple-gate MOSFETs; roll-off; threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
Type :
conf
DOI :
10.1109/CICC.2007.4405679
Filename :
4405679
Link To Document :
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