Title :
Test data compression based on output dependence
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
In a large circuit it is common to find that an output of the circuit depends structurally on a proper subset of the circuit inputs. We use this observation to provide test data compression. The proposed approach can be used in addition to test data compression techniques based on encoding.
Keywords :
automatic test pattern generation; data compression; logic testing; ATPG; output dependence; test application scheme; test data compression; Circuit faults; Circuit testing; Cities and towns; Data compression; Encoding; Fault detection; Test data compression;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition, 2003
Print_ISBN :
0-7695-1870-2
DOI :
10.1109/DATE.2003.1253793
