DocumentCode
2413309
Title
Wavelet based prognosis for fault tolerant control of induction motor with stator and speed sensor faults
Author
Gaied, Khalaf S. ; Ping, Hew W. ; Uddin, M. Nasir ; Khalid, Mustafa ; Saghafina, Ali
Author_Institution
UMPEDAC, Univ. of Malaya, Kuala Lumpur, Malaysia
fYear
2012
fDate
7-11 Oct. 2012
Firstpage
1
Lastpage
8
Abstract
This paper presents a wavelet based prognosis techniques for fault tolerant control (FTC) of induction motor drive. The wavelet is used for analysis in fault detection due to its good filtering characteristics, localized capability and superior de-noising. The FT algorithm is applied to a 1 kW induction motor (IM) to maintain the performance of the machine at an acceptable level. The FTC algorithm has been implemented in a new topology to ensure best performance recovery in case of open and short stator winding faults as well as speed sensor faults. In the worst scenario of operation, a protection stage has been implemented to stop motor operation. Experimental results demonstrate the reliability and effectiveness of the technique for diagnosis and prognosis of stator and speed sensor faults. The Texas Instrument TMS 320F28335 is used for the real-time implementation of the proposed wavelet based prognosis and the FTC of IM drive under different fault situations.
Keywords
electric sensing devices; fault diagnosis; fault tolerance; induction motor drives; machine control; reliability; stators; wavelet transforms; FT algorithm; FTC; IM drive; Texas Instrument TMS 320F28335; fault detection analysis; fault tolerant control; filtering characteristics; induction motor drive; power 1 kW; reliability; short stator winding faults; speed sensor fault diagnosis; wavelet based prognosis; Decision support systems; Induction motors; Real-time systems; Sensors; Stator windings; Velocity measurement; Fault tolerant control; Induction motor; Prognosis; RealTime Implementation; Speed sensor fault; Stator winding fault; Wavelet;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting (IAS), 2012 IEEE
Conference_Location
Las Vegas, NV
ISSN
0197-2618
Print_ISBN
978-1-4673-0330-9
Electronic_ISBN
0197-2618
Type
conf
DOI
10.1109/IAS.2012.6374029
Filename
6374029
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