Title :
A method for identifying EMI critical circuits during development of a large C3
Author :
Barr, Douglas H.
Author_Institution :
Boeing Aerospace, Seattle, WA, USA
Abstract :
The circuit analysis methods and process Boeing Aerospace used on a large, ground-based military command, control, and communications (C 3) system are described. This analysis was designed to help identify electromagnetic interference (EMI) critical circuits. The methodology used the MIL-E-6051 equipment criticality categories as the basis for defining critical circuits, relational database technology to help sort through and account for all of the approximately 5000 system signal cables, and Macintosh Plus personal computers to predict critical circuits based on safety margin analysis. The EMI circuit analysis process systematically examined all system circuits to identify which ones were likely to be EMI critical. The process used two separate, sequential safety margin analyses to identify critical circuits (conservative safety margin analysis, and detailed safety margin analysis). These analyses used field-to-wire and wire-to-wire coupling models using both worst-case and detailed circuit parameters (physical and electrical) to predict circuit safety margins. This process identified the predicted critical circuits that could then be verified by test
Keywords :
circuit CAD; command and control systems; electromagnetic interference; microcomputer applications; Boeing Aerospace; C3 system; EMI critical circuits; MIL-E-6051 equipment; Macintosh Plus personal computers; circuit analysis methods; circuit parameters; command and control systems; communication systems; electromagnetic interference; field-to-wire coupling models; military systems; relational database; safety margin analysis; system signal cables; wire-to-wire coupling models; Aerospace control; Circuit analysis; Circuit testing; Communication system control; Control systems; Electromagnetic analysis; Electromagnetic interference; Military communication; Relational databases; Safety;
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/NSEMC.1989.37153