DocumentCode
2413404
Title
The "point" potential distribution research with use of the measuring computer system
Author
Grishenko, V.L. ; Matveeva, I.A.
Author_Institution
Sci.-Res. Inst. of Mechanic & Phys., Chemyshevski Saratov State Univ., Russia
fYear
2002
fDate
18-19 Sept. 2002
Firstpage
283
Lastpage
289
Abstract
The measuring computer system (MCS) have been designed and created for noncontact nondestructive measurement of potential and charge surface distributions. Special potential "point" tests have been designed and created for determination of MCS space resolution and sensitivity. Experimental results of test potential distribution research are considered.
Keywords
charge measurement; computerised instrumentation; surface potential; voltage measurement; measuring computer system; noncontact nondestructive measurement; point potential distribution; surface charge distribution; surface potential distribution; Charge measurement; Current measurement; Distributed computing; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering, 2002. (APEDE 2002). Fifth International Conference on
Conference_Location
Saratova, Russia
Print_ISBN
5-7433-1065-3
Type
conf
DOI
10.1109/APEDE.2002.1044945
Filename
1044945
Link To Document