DocumentCode :
2413738
Title :
Measurement Aided Model Design for WCDMA Link Error Statistics
Author :
Laner, Markus ; Svoboda, Philipp ; Rupp, Markus
Author_Institution :
Inst. of Commun. & Radio-Freq. Eng., Vienna Univ. of Technol., Vienna, Austria
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
1
Lastpage :
5
Abstract :
Accurate models for error characteristics of radio channels are essential to estimate performance of data transmission. This paper analyzes error-gap and error-burst statistics of the WCDMA dedicated channel (DCH) and provides respective models. We start with an analytical study of the outer-loop power control mechanism (OLPC), which gives directions to this work, revealing that the OLPC strongly influence error behavior. We prove this by large-scale measurements at the Iub-interface of a live UMTS network. Beside statistical evaluation of the measurement data we provide a simple generative hidden Markov model for emulation of DCH errors. It is able to characterize any arbitrary DCH by only two parameters, with an accuracy below 1%, in terms of Kullback-Leibler divergence. This novel model presents an accurate light-weight alternative to complex tools for simulation of WCDMA DCH connections. It also covers all other communication technologies deploying a similar power control mechanism.
Keywords :
3G mobile communication; code division multiple access; data communication; error statistics; hidden Markov models; power control; radio links; wireless channels; DCH error emulation; Iub-interface; Kullback-Leibler divergence; OLPC; WCDMA dedicated channel; WCDMA link error statistics; data transmission; error burst statistics; error gap analysis; hidden Markov model; live UMTS network; measurement aided model design; outer loop power control mechanism; radio channel; Error analysis; Hidden Markov models; Markov processes; Measurement uncertainty; Multiaccess communication; Power control; Spread spectrum communication;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (ICC), 2011 IEEE International Conference on
Conference_Location :
Kyoto
ISSN :
1550-3607
Print_ISBN :
978-1-61284-232-5
Electronic_ISBN :
1550-3607
Type :
conf
DOI :
10.1109/icc.2011.5962895
Filename :
5962895
Link To Document :
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