• DocumentCode
    2413747
  • Title

    A low voltage embedded single port SRAM generator in a 0.18 μm standard CMOS process

  • Author

    Frey, C. ; Genevaux, E. ; Issartel, C. ; Turgis, D. ; Schoellkopf, JP

  • Author_Institution
    ST Microelectron., Crolles, France
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    106
  • Lastpage
    110
  • Abstract
    A low voltage embedded single port SRAM memory generator implemented in a 6 metals, 0.18 μm standard CMOS process is described. The typical (8k×16) cut achieves 300 MHz maximum frequency, with a 3.3 ns access time at 1.3 V and 25°C and a typical power of 60 μA/MHz at 1.3 V. Special care has been taken to reduce the standby current as well. The hierarchical wordline architecture, and a differential output bus allow low power characteristics. At the same time high speed is reached, especially thanks to a novel dynamic wordline decoder. The generator ranges from 1 Kbit to 2 Mbit and features an optional programmable redundancy
  • Keywords
    CMOS digital integrated circuits; SRAM chips; differential output bus; dynamic wordline decoder; hierarchical wordline architecture; low voltage embedded single port SRAM generator; optional programmable redundancy; standard CMOS process; CMOS process; CMOS technology; Decoding; Energy consumption; Integrated circuit interconnections; Low voltage; Memory architecture; Pulse amplifiers; Random access memory; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design and Testing, 2000. Records of the 2000 IEEE International Workshop on
  • Conference_Location
    San Jose, CA
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-0689-5
  • Type

    conf

  • DOI
    10.1109/MTDT.2000.868623
  • Filename
    868623