DocumentCode
2413747
Title
A low voltage embedded single port SRAM generator in a 0.18 μm standard CMOS process
Author
Frey, C. ; Genevaux, E. ; Issartel, C. ; Turgis, D. ; Schoellkopf, JP
Author_Institution
ST Microelectron., Crolles, France
fYear
2000
fDate
2000
Firstpage
106
Lastpage
110
Abstract
A low voltage embedded single port SRAM memory generator implemented in a 6 metals, 0.18 μm standard CMOS process is described. The typical (8k×16) cut achieves 300 MHz maximum frequency, with a 3.3 ns access time at 1.3 V and 25°C and a typical power of 60 μA/MHz at 1.3 V. Special care has been taken to reduce the standby current as well. The hierarchical wordline architecture, and a differential output bus allow low power characteristics. At the same time high speed is reached, especially thanks to a novel dynamic wordline decoder. The generator ranges from 1 Kbit to 2 Mbit and features an optional programmable redundancy
Keywords
CMOS digital integrated circuits; SRAM chips; differential output bus; dynamic wordline decoder; hierarchical wordline architecture; low voltage embedded single port SRAM generator; optional programmable redundancy; standard CMOS process; CMOS process; CMOS technology; Decoding; Energy consumption; Integrated circuit interconnections; Low voltage; Memory architecture; Pulse amplifiers; Random access memory; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design and Testing, 2000. Records of the 2000 IEEE International Workshop on
Conference_Location
San Jose, CA
ISSN
1087-4852
Print_ISBN
0-7695-0689-5
Type
conf
DOI
10.1109/MTDT.2000.868623
Filename
868623
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