• DocumentCode
    2414329
  • Title

    Are lithium ion cells Intrinsically Safe?

  • Author

    Dubaniewicz, Thomas H., Jr. ; DuCarme, Joseph P.

  • Author_Institution
    Office of Mine Safety & Health Res., Nat. Inst. for Occupational Safety & Health, Pittsburgh, PA, USA
  • fYear
    2012
  • fDate
    7-11 Oct. 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    National Institute for Occupational Safety and Health (NIOSH) researchers are studying the potential for Li-ion battery thermal runaway from an internal short circuit in equipment approved as permissible for use in underground coal mines. Researchers used a plastic wedge to induce internal short circuits for thermal runaway susceptibility evaluation purposes, which proved to be a more severe test than the flat plate method for selected Li-ion cells. Researchers conducted cell crush tests within a 20-L chamber filled with 6.5% CH4-air to simulate the mining hazard. Results indicate that LG Chem ICR18650S2 LiCoO2 cells pose a CH4 explosion hazard from a cell internal short circuit. Under specified test conditions, A123 Systems 26650 LiFePO4 cells were safer than the LG Chem ICR18650S2 LiCoO2 cells at a conservative statistical significance level.
  • Keywords
    crushing; explosions; hazards; lithium; lithium compounds; mining industry; occupational health; occupational safety; plastics; secondary cells; underground equipment; A123 system; LG Chem ICR18650S2; Li; Li-ion battery thermal runaway; LiCoO2; NIOSH researcher; National Institute for Occupational Safety and Health researcher; cell crush testing; cell internal short circuit; chamber; explosion hazard; flat plate method; lithium ion cell; mining hazard simulation; plastic wedge; statistical significance level; thermal runaway susceptibility evaluation purpose; underground coal mine; Batteries; Explosions; Fires; IEC standards; Ignition; Plastics; Batteries; Electrical accidents; Explosion protection; Fires; Hazardous areas; Ignition; Mining industry; Occupational safety; Standardization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Society Annual Meeting (IAS), 2012 IEEE
  • Conference_Location
    Las Vegas, NV
  • ISSN
    0197-2618
  • Print_ISBN
    978-1-4673-0330-9
  • Electronic_ISBN
    0197-2618
  • Type

    conf

  • DOI
    10.1109/IAS.2012.6374075
  • Filename
    6374075