• DocumentCode
    2414493
  • Title

    A Sample-Time Error Compensation Technique for Time-Interleaved ADC Systems

  • Author

    Haftbaradaran, Afshin ; Martin, Kenneth W.

  • Author_Institution
    Toronto Univ., Toronto
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    341
  • Lastpage
    344
  • Abstract
    Sample-time error among different channels of a time-interleaved analog-to-digital converter (ADC) is a factor in significant degradation of the ADC performance, especially in high frequencies. A two-channel, time-interleaved ADC structure with a background sample-time error compensation technique has been implemented. The sample-time error detection technique uses random data and has been implemented in the digital domain at a low level of complexity. The error correction is performed by adjusting the delay of the clock path of one channel, using a 6-bit digitally-controlled delay element (DCDE). At a sampling rate of 400 MSamples/s, the experimental results show that the spurious-free dynamic range (SFDR) of the ADC system is improved to 58.8 dB at 190 MHz. The ADC system achieves a signal-to-noise-and-distortion ratio (SNDR) of 59.6 dB at 5 MHz and 55.2 dB at 190 MHz after compensation. This error compensation method is especially suitable for time-interleaved ADCs used in digital data communication systems.
  • Keywords
    analogue-digital conversion; error compensation; analog-to-digital converter; clock path delay; digital data communication systems; digitally-controlled delay element; error correction; frequency 190 MHz; frequency 5 MHz; noise figure 55.2 dB; noise figure 59.6 dB; random data; sample-time error compensation technique; sample-time error detection technique; spurious-free dynamic range; time-interleaved ADC systems; two-channel ADC; Analog-digital conversion; Clocks; Data communication; Degradation; Delay; Dynamic range; Error compensation; Error correction; Frequency conversion; Sampling methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-1623-3
  • Electronic_ISBN
    978-1-4244-1623-3
  • Type

    conf

  • DOI
    10.1109/CICC.2007.4405748
  • Filename
    4405748