Title :
Low frequency 1/f noise in graphene FETs
Author :
Tiaoyang Li ; Qingguo Gao ; Zijun Wei ; Xuefei Li ; Yunyi Fu ; Yanqing Wu
Author_Institution :
Wuhan High Magn. Field Center, Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
The exceptional properties of graphene create opportunities for application in electronic devices, such as sensor and radio frequency (RF) circuits. In these applications, low frequency noise is a key figure of merit and sometimes a limiting factor in their performance. In this study, we investigate low frequency 1/f noise of top-gate graphene field effect transistors (GFETs) from room temperature down to low temperature. We systematically study the 1/f noise properties and their dependence on carrier density, temperature and channel length.
Keywords :
1/f noise; field effect transistors; graphene; 1/f noise; FET; electronic devices; radio frequency circuits; sensor; temperature 293 K to 298 K; top-gate graphene field effect transistors; Abstracts; Distance measurement; Frequency control; Metals; Noise; Noise measurement; Performance evaluation;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
DOI :
10.1109/ICSICT.2014.7021167