DocumentCode :
241507
Title :
Study of sparkover issue in packaging
Author :
Song Li ; Chuan-Bin Zeng ; Tao Ni ; Jia-Jun Luo ; Zheng-Sheng Han
Author_Institution :
Inst. of Microelectron., Beijing, China
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
3
Abstract :
A premature failure has been investigated and proved to be caused by the sparkover between no-connect metal cover and chip of ceramic packaging. Sparkover-induced model with the parasitic parameters of human body and ESD(electrostatic discharge) tester was created to explain the failure mechanism. Simulation and experiment were performed to verify the models´ accuracy. Furthermore, the first peak and second peak of the discharge current were studied by experimenting on printed circuit board designed on the basis of sparkover-induced model. The results show the discharge current is influenced by a series of parameters, such as spacing, area, parasitic capacitance and so on.
Keywords :
ceramic packaging; electrostatic discharge; failure analysis; printed circuits; sparks; ESD tester; ceramic packaging; discharge current; electrostatic discharge; failure mechanism; no-connect metal cover; printed circuit board; sparkover-induced model; Abstracts; Military standards; Oscilloscopes; Packaging; Parasitic capacitance; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021173
Filename :
7021173
Link To Document :
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