DocumentCode
241507
Title
Study of sparkover issue in packaging
Author
Song Li ; Chuan-Bin Zeng ; Tao Ni ; Jia-Jun Luo ; Zheng-Sheng Han
Author_Institution
Inst. of Microelectron., Beijing, China
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
3
Abstract
A premature failure has been investigated and proved to be caused by the sparkover between no-connect metal cover and chip of ceramic packaging. Sparkover-induced model with the parasitic parameters of human body and ESD(electrostatic discharge) tester was created to explain the failure mechanism. Simulation and experiment were performed to verify the models´ accuracy. Furthermore, the first peak and second peak of the discharge current were studied by experimenting on printed circuit board designed on the basis of sparkover-induced model. The results show the discharge current is influenced by a series of parameters, such as spacing, area, parasitic capacitance and so on.
Keywords
ceramic packaging; electrostatic discharge; failure analysis; printed circuits; sparks; ESD tester; ceramic packaging; discharge current; electrostatic discharge; failure mechanism; no-connect metal cover; printed circuit board; sparkover-induced model; Abstracts; Military standards; Oscilloscopes; Packaging; Parasitic capacitance; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021173
Filename
7021173
Link To Document