• DocumentCode
    241507
  • Title

    Study of sparkover issue in packaging

  • Author

    Song Li ; Chuan-Bin Zeng ; Tao Ni ; Jia-Jun Luo ; Zheng-Sheng Han

  • Author_Institution
    Inst. of Microelectron., Beijing, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A premature failure has been investigated and proved to be caused by the sparkover between no-connect metal cover and chip of ceramic packaging. Sparkover-induced model with the parasitic parameters of human body and ESD(electrostatic discharge) tester was created to explain the failure mechanism. Simulation and experiment were performed to verify the models´ accuracy. Furthermore, the first peak and second peak of the discharge current were studied by experimenting on printed circuit board designed on the basis of sparkover-induced model. The results show the discharge current is influenced by a series of parameters, such as spacing, area, parasitic capacitance and so on.
  • Keywords
    ceramic packaging; electrostatic discharge; failure analysis; printed circuits; sparks; ESD tester; ceramic packaging; discharge current; electrostatic discharge; failure mechanism; no-connect metal cover; printed circuit board; sparkover-induced model; Abstracts; Military standards; Oscilloscopes; Packaging; Parasitic capacitance; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021173
  • Filename
    7021173