DocumentCode :
2415595
Title :
Scalable fault-tolerant logic system based on regular array of locally interconnected gates
Author :
Flak, Jacek ; Laiho, Mika ; Paasio, Ari
Author_Institution :
VTT Tech. Res. Centre of Finland, Espoo
fYear :
2008
fDate :
14-16 July 2008
Firstpage :
116
Lastpage :
119
Abstract :
This paper presents a new approach towards fault-tolerant information processing. The proposed system combines different types of redundancy into a solution suitable for implementation with nanodevices. The architecture is based on regular array of locally interconnected processing elements (PE). The interconnections are binary programmable in order to achieve network versatility. The array can be divided into a set of segments in a flexible manner, providing a means for implementing functions with different levels of complexity and redundancy.
Keywords :
fault tolerant computing; logic circuits; logic gates; nanotechnology; fault-tolerant logic system; information processing; interconnected gates; interconnected processing elements; nanodevices; network versatility; CMOS technology; Circuit faults; Circuit noise; Energy efficiency; Fault tolerant systems; Integrated circuit interconnections; Logic arrays; Nanoscale devices; Power system reliability; Redundancy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Cellular Neural Networks and Their Applications, 2008. CNNA 2008. 11th International Workshop on
Conference_Location :
Santiago de Compostela
Print_ISBN :
978-1-4244-2089-6
Electronic_ISBN :
978-1-4244-2090-2
Type :
conf
DOI :
10.1109/CNNA.2008.4588661
Filename :
4588661
Link To Document :
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