• DocumentCode
    2415611
  • Title

    Obtaining Frequency Sensitivities to Variations Analytically from Parameterized Nonlinear Oscillator Phase Macromodels

  • Author

    Wang, Zhichun ; Roychowdhury, Jaijeet

  • Author_Institution
    Minnesota Univ., Minneapolis
  • fYear
    2007
  • fDate
    16-19 Sept. 2007
  • Firstpage
    611
  • Lastpage
    614
  • Abstract
    System-level variability analysis and design centering for oscillators relies on fast and accurate methods for obtaining the parametric sensitivities of higher-level performances (such as center frequency) directly from phase macromodels. We present an efficient and elegant method, involving no numerical simulation, for finding parametric sensitivities of oscillator frequencies directly from nonlinear phase domain macromodels. We validate the method, termed FS-PPV, on numerically extracted ring and LC oscillator PPV macromodels, as well as on a purely analytical exact PPV macromodel for idealized ring oscillators. We apply FS-PPV to find statistical distributions of oscillator center frequencies and validate these distributions against Monte-Carlo simulations. FS-PPV achieves speedups of more than 3000times over brute-force Monte-Carlo based parameter variation analysis.
  • Keywords
    parametric oscillators; sensitivity analysis; statistical distributions; FS-PPV; LC oscillator; Monte-Carlo simulations; PPV macromodels; design centering; frequency sensitivity; nonlinear phase domain macromodels; oscillator center frequency; oscillator frequency; parameter variation analysis; parameterized nonlinear oscillator phase macromodels; parametric sensitivity; ring oscillators; statistical distributions; system-level variability analysis; Cells (biology); Circuit simulation; Computational modeling; Frequency; Performance analysis; Ring oscillators; Semiconductor process modeling; Statistical analysis; Statistical distributions; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-1623-3
  • Electronic_ISBN
    978-1-4244-1623-3
  • Type

    conf

  • DOI
    10.1109/CICC.2007.4405806
  • Filename
    4405806