DocumentCode
2415611
Title
Obtaining Frequency Sensitivities to Variations Analytically from Parameterized Nonlinear Oscillator Phase Macromodels
Author
Wang, Zhichun ; Roychowdhury, Jaijeet
Author_Institution
Minnesota Univ., Minneapolis
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
611
Lastpage
614
Abstract
System-level variability analysis and design centering for oscillators relies on fast and accurate methods for obtaining the parametric sensitivities of higher-level performances (such as center frequency) directly from phase macromodels. We present an efficient and elegant method, involving no numerical simulation, for finding parametric sensitivities of oscillator frequencies directly from nonlinear phase domain macromodels. We validate the method, termed FS-PPV, on numerically extracted ring and LC oscillator PPV macromodels, as well as on a purely analytical exact PPV macromodel for idealized ring oscillators. We apply FS-PPV to find statistical distributions of oscillator center frequencies and validate these distributions against Monte-Carlo simulations. FS-PPV achieves speedups of more than 3000times over brute-force Monte-Carlo based parameter variation analysis.
Keywords
parametric oscillators; sensitivity analysis; statistical distributions; FS-PPV; LC oscillator; Monte-Carlo simulations; PPV macromodels; design centering; frequency sensitivity; nonlinear phase domain macromodels; oscillator center frequency; oscillator frequency; parameter variation analysis; parameterized nonlinear oscillator phase macromodels; parametric sensitivity; ring oscillators; statistical distributions; system-level variability analysis; Cells (biology); Circuit simulation; Computational modeling; Frequency; Performance analysis; Ring oscillators; Semiconductor process modeling; Statistical analysis; Statistical distributions; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-1623-3
Electronic_ISBN
978-1-4244-1623-3
Type
conf
DOI
10.1109/CICC.2007.4405806
Filename
4405806
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