• DocumentCode
    2415932
  • Title

    A cognitive virtual microscopic framework for knowlege-based exploration of large microscopic images in breast cancer histopathology

  • Author

    Roux, Ludovic ; Tutac, Adina ; Loménie, Nicolas ; Balensi, Didier ; Racoceanu, Daniel ; Veillard, Antoine ; Leow, Wee-Kheng ; Klossa, Jacques ; Putti, Thomas C.

  • Author_Institution
    IPAL (Image&Pervasive Access Lab.), Univ. Joseph Fourier (UJF), Grenoble, France
  • fYear
    2009
  • fDate
    3-6 Sept. 2009
  • Firstpage
    3697
  • Lastpage
    3702
  • Abstract
    Histopathological examination is a powerful method for prognosis of major diseases such as breast cancer. Analysis of medical images largely remains the work of human experts. Current virtual microscope systems are mainly an emulation of real microscopes with annotation and some image analysis capabilities. However, the lack of effective knowledge management prevents such systems from being computer-aided prognosis platforms. The cognitive virtual microscopic framework, through an extended modeling and use of medical knowledge, has the capacity to analyse histopathological images and to perform grading of breast cancer, providing pathologists with a robust and traceable second opinion.
  • Keywords
    biomedical imaging; cancer; cognitive systems; knowledge based systems; mammography; medical diagnostic computing; microscopy; tumours; virtual reality; annotation; breast cancer histopathology; cognitive virtual microscopic framework; computer-aided prognosis; disease prognosis; histopathological image; knowledge management; knowledge-based exploration; medical image analysis; microscopic images; Algorithms; Breast Neoplasms; Cognition; Computer Graphics; Computers; Diagnostic Imaging; Female; Humans; Image Processing, Computer-Assisted; Knowledge Bases; Medical Oncology; Microscopy; Prognosis; Software; User-Computer Interface;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-3296-7
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2009.5334739
  • Filename
    5334739