DocumentCode :
2415974
Title :
Plasma physics simulations of double potential wells in an inertial electrostatic confinement (IEC) device
Author :
Tzonev, I.V. ; Miley, George H. ; Nebel, R.A.
Author_Institution :
Fusion Studies Lab., Urbana, IL, USA
fYear :
1995
fDate :
5-8 June 1995
Firstpage :
258
Abstract :
Summary form only given. The formation and behavior of double potential wells in an IEC fusion device was investigated using IXL-a one-dimensional code that solves the Poisson-Vlasov equations for a collisionless spherical plasma. IXL results represent an important limiting case where space charge effects dominate. The formation of a deep and stable double well is essential for good ion confinement, hence successful development of the IEC device as a future power source. The dependence of the double well depth and width on the plasma parameters (ion and electron currents, radial and perpendicular energy spread, ion and electron injection energies) was studied. The changes of the ion and electron densities and the fusion rate in the presence of the double well were investigated. The fusion core radius and its variation with plasma parameters were evaluated.
Keywords :
electron density; ion density; plasma confinement; plasma density; plasma diagnostics; plasma inertial confinement; plasma simulation; IXL one-dimensional code; Poisson-Vlasov equations; collisionless spherical plasma; double potential wells; double well depth; electron currents; electron density; electron energy spread; electron injection energies; fusion device; fusion rate; inertial electrostatic confinement device; ion confinement; ion currents; ion density; ion electron injection energies; ion energy spread; plasma parameters; plasma physics simulations; power source; space charge effects; Electrons; IEC; Physics; Plasma confinement; Plasma density; Plasma devices; Plasma simulation; Plasma sources; Plasma stability; Potential well;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location :
Madison, WI, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-2669-5
Type :
conf
DOI :
10.1109/PLASMA.1995.533474
Filename :
533474
Link To Document :
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