DocumentCode
2416467
Title
Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips
Author
Robson, Norm ; Safran, John ; Kothandaraman, Chandrasekharan ; Cestero, Alberto ; Chen, Xiang ; Rajeevakumar, Raj ; Leslie, Alan ; Moy, Dan ; Kirihata, Toshiaki ; Iyer, Subramanian
Author_Institution
IBM, Hopewell
fYear
2007
fDate
16-19 Sept. 2007
Firstpage
799
Lastpage
804
Abstract
Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.
Keywords
electric fuses; analog device trimming; autonomic chips; chip identification; eFuse; electrically programmable fuse; memory redundancy; Cathodes; Circuits; Electromigration; Fuses; Laser theory; MOS devices; Nonvolatile memory; System testing; Very large scale integration; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-1623-3
Electronic_ISBN
978-1-4244-1623-3
Type
conf
DOI
10.1109/CICC.2007.4405850
Filename
4405850
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