Title :
Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips
Author :
Robson, Norm ; Safran, John ; Kothandaraman, Chandrasekharan ; Cestero, Alberto ; Chen, Xiang ; Rajeevakumar, Raj ; Leslie, Alan ; Moy, Dan ; Kirihata, Toshiaki ; Iyer, Subramanian
Author_Institution :
IBM, Hopewell
Abstract :
Electrical fuse (eFUSE) has become a popular choice to enable memory redundancy, chip identification and authentication, analog device trimming, and other applications. We will review the evolution and applications of electrical fuse solutions for 180 nm to 45 nm technologies at IBM, and provide some insight into future uses in 32 nm technology and beyond with the eFUSE as a building block for the autonomic chip of the future.
Keywords :
electric fuses; analog device trimming; autonomic chips; chip identification; eFuse; electrically programmable fuse; memory redundancy; Cathodes; Circuits; Electromigration; Fuses; Laser theory; MOS devices; Nonvolatile memory; System testing; Very large scale integration; Wiring;
Conference_Titel :
Custom Integrated Circuits Conference, 2007. CICC '07. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-1623-3
Electronic_ISBN :
978-1-4244-1623-3
DOI :
10.1109/CICC.2007.4405850
