Title :
Physics of failure - the basic materials science behind failures
Author_Institution :
M/A-COM
Keywords :
Chemical technology; Corrosion; Creep; Electric shock; Intermetallic; Materials science and technology; Materials testing; Physics; Probability; Reliability engineering;
Conference_Titel :
GaAs Reliability Workshop, 2001. Proceedings
Print_ISBN :
0-7908-0066-7
DOI :
10.1109/GAASRW.2001.995733