Title :
High frequency characterization of high-temperature superconducting thin film lines
Author :
Van Deventer, T.E. ; Katehi, P.B. ; Josefowicz, J.Y. ; Rensch, D.B.
Author_Institution :
Radiat. Lab., Michigan Univ., Ann Arbor, MI, USA
Abstract :
An integral equation approach is used to calculate the propagation characteristics of high-temperature thin-film superconducting lines at high frequencies. To evaluate losses in these lines, the superconducting strips are replaced by frequency-dependent surface impedance boundaries. The values of these surface impedances are measured experimentally by a stripline resonator technique. Using this method, phase and attenuation constants as well as characteristic impedance are evaluated and presented as functions of frequency and several other parameters.<>
Keywords :
high-temperature superconductors; microwave measurement; strip lines; superconducting thin films; HF characterisation; attenuation constants; characteristic impedance; frequency-dependent surface impedance boundaries; functions of frequency; high temperature superconductors; high-temperature superconducting thin film lines; integral equation approach; phase constants; propagation characteristics; stripline resonator technique; superconducting strips; Frequency; High temperature superconductors; Impedance measurement; Integral equations; Strips; Superconducting films; Superconducting microwave devices; Superconducting thin films; Surface impedance; Surface resistance;
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
DOI :
10.1109/MWSYM.1990.99575
