DocumentCode :
241715
Title :
Towards steep slope MOSFETs using ferroelectric negative capacitance
Author :
O´Neill, A. ; Appleby, D. ; Ponon, N. ; Kwa, K.
Author_Institution :
Sch. of Electr. & Electron. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
4
Abstract :
Effective negative capacitance has been postulated in ferroelectrics because there is hysteresis in plots of polarization-electric field. In future integrated circuits, the incorporation of negative capacitance into MOSFET gate stacks would reduce the sub-threshold slope, enabling low power operation and reduced self-heating. As a step towards meeting this challenge, effective negative capacitance is demonstrated at room temperature in metal-insulator-metal capacitors, where it is stabilized by the presence of a paraelectric material.
Keywords :
MIM devices; MOSFET; dielectric hysteresis; dielectric materials; ferroelectric semiconductors; ferroelectric negative capacitance; gate stack; hysteresis; integrated circuit; low power operation; metal-insulator-metal capacitor; paraelectric material; polarization-electric field; self-heating reduction; steep slope MOSFET; subthreshold slope; Abstracts; Capacitance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021281
Filename :
7021281
Link To Document :
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