• DocumentCode
    241717
  • Title

    A new low power unipolar CMOS

  • Author

    Jyi-Tsong Lin ; Haga, Steve ; Ming-Tsung Shih ; Yong-Huang Lin

  • Author_Institution
    Depts. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Although CMOS is the most popular technology for integrated circuits, a disadvantage is that it requires both NMOS and PMOS transistors. In contrast, this paper describes a new unipolar CMOS technology that replaces the PMOS transistor with a modified NMOS containing an elevated body and two embedded oxides (EBTEO). This modified NMOS makes use of the punch-through effect to achieve voltage-controlled on-off behavior. Two different gate work functions are performed for the unipolar CMOS to cause it to operate in the subthreshold region. Extended TCAD simulations are carried out to verify that the proposed EBTEO structure can obtain favorable inverter and logic gate output characteristics. Thus, it can be used for any CMOS logic circuits, including both static and dynamic logic families. By using different gate work functions for the unipolar CMOSs and allowing them to operate in the sub-threshold regime, the gate delay time can be reduced by more than 30 %, and the power consumption is also reduced greatly when compared with a conventional CMOS. Consequently, the EBTEO with SOI substrate significantly reduces the figure of merit, the delay-power product (DP), by more than 46 %.
  • Keywords
    CMOS logic circuits; MOSFET; low-power electronics; silicon-on-insulator; EBTEO structure; NMOS transistors; PMOS transistors; SOI substrate; complementary metal oxide semiconductor; delay-power product; dynamic logic families; elevated body; embedded oxides; extended TCAD simulations; gate work functions; integrated circuits; inverter characteristics; logic circuits; logic gate output characteristics; low power unipolar CMOS; punch-through effect; static logic families; subthreshold regime; voltage-controlled on-off behavior; Jamming;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021282
  • Filename
    7021282