Title :
Nonlinear dimensionality reduction of electroencephalogram (EEG) for Brain Computer interfaces
Author :
Teli, Mohammad Nayeem ; Anderson, Charles
Author_Institution :
Dept. of Comput. Sci., Colorado State Univ., Fort Collins, CO, USA
Abstract :
Patterns in electroencephalogram (EEG) signals are analyzed for a brain computer interface (BCI). An important aspect of this analysis is the work on transformations of high dimensional EEG data to low dimensional spaces in which we can classify the data according to mental tasks being performed. In this research we investigate how a neural network (NN) in an auto-encoder with bottleneck configuration can find such a transformation. We implemented two approximate second-order methods to optimize the weights of these networks, because the more common first-order methods are very slow to converge for networks like these with more than three layers of computational units. The resulting non-linear projections of time embedded EEG signals show interesting separations that are related to tasks. The bottleneck networks do indeed discover nonlinear transformations to low-dimensional spaces that capture much of the information present in EEG signals. However, the resulting low-dimensional representations do not improve classification rates beyond what is possible using quadratic discriminant analysis (QDA) on the original time-lagged EEG.
Keywords :
brain-computer interfaces; electroencephalography; medical signal processing; signal classification; BCI; EEG; brain computer interface; electroencephalogram; mental task; neural network; nonlinear dimensionality reduction; quadratic discriminant analysis; Algorithms; Brain; Computers; Discriminant Analysis; Electroencephalography; Humans; Man-Machine Systems; Models, Statistical; Neural Networks (Computer); Pattern Recognition, Automated; Reproducibility of Results; Signal Processing, Computer-Assisted; User-Computer Interface;
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2009.5334802