Title :
A background time-skew calibration for flash-assisted time-interleaved SAR ADCS with redundant check bit
Author :
Sijia Ma ; Yongzhen Chen ; Fan Ye ; Junyan Ren
Author_Institution :
State-Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
Abstract :
This paper describes a timing-skew calibration technique in the flash-assisted (FA) time-interleaved (TI) successive approximation register (SAR) ADC structure, which eliminate the phase error between the frontend Flash ADC´s and the sub-SAR ADCs´ sampling clocks. Based on the skew information detected by the redundant check bit implemented in Flash ADC, the clocks of the time-interleaved SAR ADCs are adaptively synchronized with that of the Flash ADC. This timing-skew calibration technique is easy for hardware realization, as only one check bit is used. The algorithm is effective in the under-sampling system, which is required by the time-interleaved sub-SAR ADCs.
Keywords :
analogue-digital conversion; calibration; flip-flops; FA time-interleaved successive approximation register SAR ADC structure; Flash ADC; flash-assisted TI SAR ADC; phase error; redundant check bit; skew information; sub-SAR ADC sampling clocks; timing-skew calibration technique; undersampling system; Abstracts;
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
DOI :
10.1109/ICSICT.2014.7021296