• DocumentCode
    241749
  • Title

    A background time-skew calibration for flash-assisted time-interleaved SAR ADCS with redundant check bit

  • Author

    Sijia Ma ; Yongzhen Chen ; Fan Ye ; Junyan Ren

  • Author_Institution
    State-Key Lab. of ASIC & Syst., Fudan Univ., Shanghai, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    This paper describes a timing-skew calibration technique in the flash-assisted (FA) time-interleaved (TI) successive approximation register (SAR) ADC structure, which eliminate the phase error between the frontend Flash ADC´s and the sub-SAR ADCs´ sampling clocks. Based on the skew information detected by the redundant check bit implemented in Flash ADC, the clocks of the time-interleaved SAR ADCs are adaptively synchronized with that of the Flash ADC. This timing-skew calibration technique is easy for hardware realization, as only one check bit is used. The algorithm is effective in the under-sampling system, which is required by the time-interleaved sub-SAR ADCs.
  • Keywords
    analogue-digital conversion; calibration; flip-flops; FA time-interleaved successive approximation register SAR ADC structure; Flash ADC; flash-assisted TI SAR ADC; phase error; redundant check bit; skew information; sub-SAR ADC sampling clocks; timing-skew calibration technique; undersampling system; Abstracts;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021296
  • Filename
    7021296