Title :
Estimating the Bayes error rate through classifier combining
Author :
Tumer, Kagan ; Ghosh, Joydeep
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
The Bayes error provides the lowest achievable error rate for a given pattern classification problem. There are several classical approaches for estimating or finding bounds for the Bayes error. One type of approach focuses on obtaining analytical bounds, which are both difficult to calculate and dependent on distribution parameters that may not be known. Another strategy is to estimate the class densities through non-parametric methods, and use these estimates to obtain bounds on the Bayes error. This article presents a novel approach to estimating the Bayes error based on classifier combining techniques. For an artificial data set where the Bayes error is known, the combiner-based estimate outperforms the classical methods
Keywords :
Bayes methods; nonparametric statistics; parameter estimation; pattern classification; Bayes error rate; analytical bounds; distribution parameters; lowest achievable error rate; nonparametric methods; pattern classification; Computer errors; Creep; Electronic mail; Error analysis; Integral equations; Pattern classification; Pattern recognition; Probability density function; Training data;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.546912