DocumentCode :
24182
Title :
An Invasive-Attack-Resistant PUF Based On Switched-Capacitor Circuit
Author :
Meilin Wan ; Zhangqing He ; Shuang Han ; Kui Dai ; Xuecheng Zou
Author_Institution :
Innovation Center for MicroNanoelectronics & Integrated Syst., Huazhong Univ. of Sci. & Technol., Wuhan, China
Volume :
62
Issue :
8
fYear :
2015
fDate :
Aug. 2015
Firstpage :
2024
Lastpage :
2034
Abstract :
An invasive-attack-resistant physical unclonable function (PUF) with strong reliability is presented. The mismatch of capacitor ratios in real fabrication is sampled by a switched-capacitor (SC) circuit and further amplified by a latch-styled sense amplifier. Transmission lines connected to the sampling capacitors are used to cover and protect the whole chip from outside invasive attacks. The proposed SC PUF is fabricated using HJ standard 0.18 μm CMOS process. Simulation results show that the invasive-attack-resistant sensitivity is less than 2.56 fF. The failed outside invasive attack efforts verify the anti-invasive-attack property of the PUF unit. Besides, measured results show that the proposed SC PUF circuit with 3 V/1.8 V-VDD achieves an error rate 1x-5.5x lower than other PUF implementations. An error correction block is also presented to achieve a nearly zero error rate. The measured average error rate, bias, average intra-die HD and average inter-die HD of the 3 V/1.8 V-VDD SC PUF with error correction block is 0%, 46.72%, 0%, and 49.84% respectively.
Keywords :
CMOS integrated circuits; amplifiers; analogue-digital conversion; error correction; switched capacitor networks; HJ standard CMOS process; SC PUF circuit; anti-invasive-attack property; error correction block; invasive-attack-resistant PUF; latch-styled sense amplifier; physical unclonable function; sampling capacitors; size 0.18 mum; switched-capacitor circuit; transmission lines; voltage 1.8 V; voltage 3 V; Capacitance; Capacitors; Metals; Power transmission lines; Probes; Security; Sensitivity; Error correc; invasive-attack-resistant; latch-styled sense amplifier; physical unclonable function; switched capacitor;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2015.2440739
Filename :
7166385
Link To Document :
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