• DocumentCode
    24182
  • Title

    An Invasive-Attack-Resistant PUF Based On Switched-Capacitor Circuit

  • Author

    Meilin Wan ; Zhangqing He ; Shuang Han ; Kui Dai ; Xuecheng Zou

  • Author_Institution
    Innovation Center for MicroNanoelectronics & Integrated Syst., Huazhong Univ. of Sci. & Technol., Wuhan, China
  • Volume
    62
  • Issue
    8
  • fYear
    2015
  • fDate
    Aug. 2015
  • Firstpage
    2024
  • Lastpage
    2034
  • Abstract
    An invasive-attack-resistant physical unclonable function (PUF) with strong reliability is presented. The mismatch of capacitor ratios in real fabrication is sampled by a switched-capacitor (SC) circuit and further amplified by a latch-styled sense amplifier. Transmission lines connected to the sampling capacitors are used to cover and protect the whole chip from outside invasive attacks. The proposed SC PUF is fabricated using HJ standard 0.18 μm CMOS process. Simulation results show that the invasive-attack-resistant sensitivity is less than 2.56 fF. The failed outside invasive attack efforts verify the anti-invasive-attack property of the PUF unit. Besides, measured results show that the proposed SC PUF circuit with 3 V/1.8 V-VDD achieves an error rate 1x-5.5x lower than other PUF implementations. An error correction block is also presented to achieve a nearly zero error rate. The measured average error rate, bias, average intra-die HD and average inter-die HD of the 3 V/1.8 V-VDD SC PUF with error correction block is 0%, 46.72%, 0%, and 49.84% respectively.
  • Keywords
    CMOS integrated circuits; amplifiers; analogue-digital conversion; error correction; switched capacitor networks; HJ standard CMOS process; SC PUF circuit; anti-invasive-attack property; error correction block; invasive-attack-resistant PUF; latch-styled sense amplifier; physical unclonable function; sampling capacitors; size 0.18 mum; switched-capacitor circuit; transmission lines; voltage 1.8 V; voltage 3 V; Capacitance; Capacitors; Metals; Power transmission lines; Probes; Security; Sensitivity; Error correc; invasive-attack-resistant; latch-styled sense amplifier; physical unclonable function; switched capacitor;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2015.2440739
  • Filename
    7166385