Title : 
Digital integrated temperature sensors for VLSI thermal management
         
        
            Author : 
Shuang Xie ; Wai Tung Ng
         
        
            Author_Institution : 
Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
         
        
        
        
        
        
            Abstract : 
VLSI thermal management system requires integrated temperature sensors to monitor on-chip hot spots. This paper reviews delay-line based integrated digital temperature sensors. More importantly, various calibration techniques for the delay-line based temperature sensor will also be discussed. In particular, an all-digital self-calibrated temperature sensor implemented entirely on an Altera Cyclone IV FPGA will be introduced. This work is further demonstrated on an emulated multi-core system to obtain the runtime thermal profiles of four different cores to facilitate the implementation of different VLSI thermal management schemes.
         
        
            Keywords : 
VLSI; calibration; delay lines; field programmable gate arrays; integrated circuit measurement; temperature measurement; temperature sensors; Altera Cyclone IV FPGA; VLSI thermal management system; all-digital self-calibrated temperature sensor; calibration techniques; delay-line based integrated digital temperature sensors; emulated multicore system; on-chip hot spot monitoring; runtime thermal profiles; CMOS integrated circuits; Calibration; Photonic band gap; Temperature measurement; Temperature sensors; Thermal management;
         
        
        
        
            Conference_Titel : 
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
         
        
            Conference_Location : 
Guilin
         
        
            Print_ISBN : 
978-1-4799-3296-2
         
        
        
            DOI : 
10.1109/ICSICT.2014.7021346