Title :
Linear feature extractors based on mutual information
Author :
Bollacker, Kurt D. ; Ghosh, Joydeep
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Abstract :
This paper presents and evaluates two linear feature extractors based on mutual information. These feature extractors consider general dependencies between features and class labels, as opposed to well known linear methods such as PCA which does not consider class labels and LDA, which uses only simple low order dependencies. As evidenced by several simulations on high dimensional data sets, the proposed techniques provide superior feature extraction and better dimensionality reduction while having similar computational requirements
Keywords :
computational complexity; feature extraction; pattern classification; class labels; computational requirements; dimensionality reduction; high dimensional data sets; linear feature extractors; mutual information; Computational modeling; Data mining; Ear; Feature extraction; Linear discriminant analysis; Mutual information; Particle measurements; Principal component analysis; Transforms; Vectors;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.546917