• DocumentCode
    241864
  • Title

    A negative voltage generator for the sample-and-hold circuit in charge-domain pipelined ADCs

  • Author

    Dong Li ; Hong Zhang ; Qing Wang ; Xiaowei Wang ; Ang Gao ; Jun Cheng

  • Author_Institution
    Dept. of Microelectron., Xi´an Jiaotong Univ., Xi´an, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A negative voltage generator for the sample-and-hold (SH) circuit in charge-domain pipelined analog to digital converters (ADCs) based on brigade-bucket devices (BBDs) is presented in this paper. In the charge transfer phase of the BBD sample-and-hold circuit, a negative voltage is produced on the bottom plate of the sampling capacitor, which may result in serious problems that the resetting switches are shut off incompletely and the drain/substrate PN junctions are forward biased. In order to solve these problems, the resetting switches are realized with NMOS transistors in deep N-well. Additionally, a negative voltage generator is proposed to generate the control signals with suitable negative voltages for the gate and substrate nodes of the resetting switches in the charge transferring phase. The negative voltage generator is designed in SMIC 0.18-μm CMOS process. Simulated results show that the required negative voltage can be generated, which ensure the correct functions of the SH circuit. The simulated signal-to-noise ratio (SNR) of the whole SH circuit is 142 dB under a sampling frequency of 125 MHz.
  • Keywords
    CMOS integrated circuits; MOSFET; analogue-digital conversion; sample and hold circuits; voltage regulators; BBD; NMOS transistors; SH circuit; SMIC 0.18-μm CMOS process; SNR; brigade-bucket devices; charge transfer phase; charge-domain pipelined ADC; charge-domain pipelined analog to digital converters; deep N-well; drain-substrate PN junctions; frequency 125 MHz; negative voltage generator; resetting switches; sample-and-hold circuit; sampling capacitor; signal-to-noise ratio; size 0.18 mum; Clocks; Control systems; Generators; Logic gates; MOS devices; Substrates; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021355
  • Filename
    7021355