DocumentCode
2418867
Title
In-situ doped and laser annealing of PECVD SiC thin film
Author
Zhang, Haixia ; Guo, Hui ; Luo, Rui ; Zhang, Guobing
Author_Institution
Inst. of Microelectron., Peking Univ., Beijing
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
33
Lastpage
36
Abstract
In this paper, in order to improve PECVD SiC´s electronics performance, in-situ doped together with laser annealing technology was put forward. NH3 was introduced as source of N in-situ doping, and laser annealing was done after deposition. Laser annealing can change the amorphous in-situ doped PECVD SiC to poly crystal, the size of crystal was growing with laser energy density, meanwhile it increasing activity and mobility of carriers, which enhance the conductivity of SiC film. Therefore, PECVD SiC film can not only be applied as structure material in MEMS devices, but also compatibles with post CMOS process.
Keywords
chemical vapour deposition; laser beam annealing; semiconductor doping; semiconductor thin films; silicon compounds; wide band gap semiconductors; PECVD; SiC; in-situ doping; laser annealing; laser energy density; thin films; Amorphous materials; Annealing; Conducting materials; Conductive films; Conductivity; Crystalline materials; Doping; Laser transitions; Silicon carbide; Transistors; PECVD SiC; in-situ doping; laser annealing; thin film;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352041
Filename
4160344
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