• DocumentCode
    2418867
  • Title

    In-situ doped and laser annealing of PECVD SiC thin film

  • Author

    Zhang, Haixia ; Guo, Hui ; Luo, Rui ; Zhang, Guobing

  • Author_Institution
    Inst. of Microelectron., Peking Univ., Beijing
  • fYear
    2007
  • fDate
    16-19 Jan. 2007
  • Firstpage
    33
  • Lastpage
    36
  • Abstract
    In this paper, in order to improve PECVD SiC´s electronics performance, in-situ doped together with laser annealing technology was put forward. NH3 was introduced as source of N in-situ doping, and laser annealing was done after deposition. Laser annealing can change the amorphous in-situ doped PECVD SiC to poly crystal, the size of crystal was growing with laser energy density, meanwhile it increasing activity and mobility of carriers, which enhance the conductivity of SiC film. Therefore, PECVD SiC film can not only be applied as structure material in MEMS devices, but also compatibles with post CMOS process.
  • Keywords
    chemical vapour deposition; laser beam annealing; semiconductor doping; semiconductor thin films; silicon compounds; wide band gap semiconductors; PECVD; SiC; in-situ doping; laser annealing; laser energy density; thin films; Amorphous materials; Annealing; Conducting materials; Conductive films; Conductivity; Crystalline materials; Doping; Laser transitions; Silicon carbide; Transistors; PECVD SiC; in-situ doping; laser annealing; thin film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    1-4244-0610-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2007.352041
  • Filename
    4160344