DocumentCode :
2419046
Title :
Analysis of bioelectrical signal of the human retina (ERG) using LabVIEW
Author :
Shankar, Uma ; Panse, M.S.
Author_Institution :
M.Tech-Electron., Veermata Jijabai Technol. Inst., Mumbai, India
fYear :
2010
fDate :
3-4 April 2010
Firstpage :
54
Lastpage :
58
Abstract :
ERG is the recording of electrical potentials evoked by a flash of light and picked up at the cornea of the eye using contact lens electrode. This paper aims to demonstrate the possibility of finding features reliable for more precise distinguishing between standard and abnormal Electroretinogram (ERG) recordings. Understanding the specific features (onset, time delay, amplitude, line shape) of the ERG components and their relationship represents the principal aim of past and present research in the field of ocular electrophysiology. ERG waveforms are simulated in LabVIEW then Analysis is carried out to detect abnormalities. ERG belonging to a subject with abnormality called Achromatopsia (ACR) and ERG belonging to a subject with abnormality called Congenital Stationary Blindness (CSNB) are simulated and analyzed. The proposed system is readily usable low cost alternative to sophisticated costly equipments used in hospitals for the ERG signal analysis purpose.
Keywords :
biomedical equipment; diseases; electroretinography; medical disorders; medical signal processing; visual evoked potentials; waveform analysis; ERG signal analysis equipments; ERG waveforms; Electroretinogram; LabVIEW; achromatopsia; bioelectrical signal analysis; congenital stationary blindness; contact lens electrode; evoked electrical potentials; human retina; ocular electrophysiology; Analytical models; Bioelectric phenomena; Contacts; Cornea; Electric potential; Electrodes; Humans; Lenses; Retina; Signal analysis; Electroretinogram(ERG); International Society for Clinical Electrophysiology of Vision(ISCEV); Laboratory for Virtual Instrumentation and Engineering Workbench (LabVIEW);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Students' Technology Symposium (TechSym), 2010 IEEE
Conference_Location :
Kharagpur
Print_ISBN :
978-1-4244-5975-9
Electronic_ISBN :
978-1-4244-5974-2
Type :
conf
DOI :
10.1109/TECHSYM.2010.5469191
Filename :
5469191
Link To Document :
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