DocumentCode :
2419567
Title :
Congruence of low voltage power main transient designs
Author :
Rhoade, William T.
Author_Institution :
Xerox Corp., El Segundo, CA, USA
fYear :
1989
fDate :
23-25 May 1989
Firstpage :
285
Lastpage :
293
Abstract :
It is argued that the conditions and problems for high-voltage protection in the 1920s to 1940s are similar to those prevailing today for low-voltage (under 1000 V RMS) power system transient protection. Data are now being collected beyond voltage crest values vs. occurrence rate such as: waveshape epoch, rate of rise, ringing periods, energy, and energy spectral density. Protection design is complicated by the wide diversity of equipment designs which are installed, differing site conditions, and the effects of load on the power main distribution with transients ranging from electrically fast nanosecond duration to very long duration. Since no present standard can adequately test for these transients, low-voltage transient protection standards are being revised. The updating of the database and equipment testing can result in better cost-effective surge protection
Keywords :
distribution networks; overvoltage protection; surge protection; transients; 1 kV; energy spectral density; low voltage power main transient designs; occurrence rate; power main distribution; power system transient protection; rate of rise; ringing periods; surge protection; voltage crest; waveshape epoch; Circuit testing; Costs; Immunity testing; Impedance; Impulse testing; Insulation; Low voltage; Power measurement; Power system transients; Surge protection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/NSEMC.1989.37194
Filename :
37194
Link To Document :
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