• DocumentCode
    2419582
  • Title

    Optimal replacement threshold and inspection interval for condition-based maintenance with variable failure cost

  • Author

    Golmakani, Hamid Reza ; Pouresmaeeli, Morteza

  • Author_Institution
    Dept. of Ind. Eng., Tafresh Univ., Tafresh, Iran
  • fYear
    2012
  • fDate
    10-13 Dec. 2012
  • Firstpage
    1944
  • Lastpage
    1948
  • Abstract
    In condition-based maintenance (CBM) with periodic inspection, the item is preventively replaced if failure risk, which is calculated based on monitoring information, exceeds a pre-determined threshold. It is also replaced if, at any time, failure occurs. In the determination of optimal replacement threshold, it is often assumed that the failure replacement cost is constant. However, this assumption is not always true as, in some practical cases; the failure replacement cost may depend on the item´s degradation state at which the failure occurs and/or the time it fails. In this paper, derivation of optimal replacement threshold and optimal inspection interval for CBM with variable failure cost is provided. The basis is the control limit policy for CBM, already developed by the researchers and referenced in the paper. The proposed approach is illustrated through a numerical example.
  • Keywords
    condition monitoring; failure (mechanical); inspection; maintenance engineering; numerical analysis; CBM; condition-based maintenance; control limit policy; failure replacement cost; failure risk; item degradation state; monitoring information; numerical analysis; optimal inspection interval; optimal replacement threshold; periodic inspection; variable failure cost; Degradation; Equations; Hazards; Inspection; Maintenance engineering; Mathematical model; Monitoring; Condition-based maintenance; optimal inspection interval; optimal replacement policy; variable failure cost;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2012 IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Type

    conf

  • DOI
    10.1109/IEEM.2012.6838085
  • Filename
    6838085