Title :
Semi-automatic measured statistics for demodulation RFI in inverting operational amplifier circuits with and without suppression capacitors
Author :
Ghadamabadi, Hamid ; Whalen, James J.
Author_Institution :
Dept. of Electr. & Comput Eng., State Univ. of New York at Buffalo, Amherst, NY, USA
Abstract :
A description is given of an investigation to determine statistical variations for radio frequency interference (RFI) demodulation responses in operational amplifier (op amp) circuits. 50% amplitude-modulated (AM) RF signals were injected into the op amp signal input terminal to produce undesired demodulated responses at a 1 kHz AM frequency. The RF frequency was varied over the range 0.1 to 400 MHz. The demodulation RFI was characterized by a nonlinear transfer function H2. The two op amp types tested were the 741 and the OP27. The results show that the OP27 has better RFI immunity than the 741 with and without RFI suppression capacitors
Keywords :
demodulation; electron device testing; interference suppression; radiofrequency interference; 0.1 to 400 MHz; 1 kHz; 741 op amp; AM signals; OP27 op amp; RFI demodulation responses; RFI immunity; inverting operational amplifier circuits; linear frequency response; nonlinear transfer function; semiautomatic measured statistics; statistical variations; suppression capacitors; Demodulation; Operational amplifiers; RF signals; Radio frequency; Radiofrequency amplifiers; Radiofrequency integrated circuits; Radiofrequency interference; Statistics; Testing; Transfer functions;
Conference_Titel :
Electromagnetic Compatibility, 1989., IEEE 1989 National Symposium on
Conference_Location :
Denver, CO
DOI :
10.1109/NSEMC.1989.37222
