DocumentCode :
2420196
Title :
A Surface Wave Thickness Monitor for Thin Evaporated Films
Author :
Hemphill, R.B.
fYear :
1973
fDate :
1973
Firstpage :
525
Lastpage :
529
Keywords :
Crystalline materials; Delay lines; Gold; Lithium niobate; Monitoring; Optical surface waves; Oscillators; Surface waves; Thickness measurement; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1973 Ultrasonics Symposium
Type :
conf
DOI :
10.1109/ULTSYM.1973.196257
Filename :
1533197
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2420196
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