DocumentCode :
2420213
Title :
Development of conductive adhesives filled with low-melting-point alloy fillers
Author :
Lu, Daoqiang ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng. & Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
2000
fDate :
2000
Firstpage :
7
Lastpage :
13
Abstract :
Conventional isotropic conductive adhesives (ICAs) are composed of a polymeric matrix with silver flakes. As an alternative to lead-bearing solder, ICAs offer a number of benefits, but limitations do exist for ICA technology. ICAs filled with silver flakes generally show higher initial contact resistance, unstable contact resistance, and inferior impact strength. In this study, a new class of isotropic conductive adhesives was developed by using two different fillers, a silver flake and a low melting point alloy filler, in the ICA formulations. After curing, the metallurgical connection between the silver particles and between the silver particles and the nickel (Ni) substrate was observed using scanning electron microscopy (SEM). Initial contact resistance and contact resistance shift during elevated temperature and humidity aging of the formulated ICAs on a non-noble metal (nickel) were investigated and compared to those of ICA filled only with the silver flake. It was found that (a) the low-melting-point alloy filler could wet the Ag flakes and nickel (Ni) substrate very well and formed metallurgical connections; and (b) this ICA showed especially low initial contact resistance and stable contact resistance during aging on nickel metal compared to the ICA filled only with silver flakes
Keywords :
adhesives; ageing; conducting materials; contact resistance; filled polymers; scanning electron microscopy; Ag; Ni; contact resistance; curing; elevated temperature aging; humidity aging; impact strength; isotropic conductive adhesive; low-melting-point alloy filler; metallurgical connection; nickel substrate; polymeric matrix; scanning electron microscopy; silver flakes; Aging; Conductive adhesives; Contact resistance; Curing; Independent component analysis; Lead; Nickel; Polymers; Scanning electron microscopy; Silver;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-59-9
Type :
conf
DOI :
10.1109/ISAPM.2000.869235
Filename :
869235
Link To Document :
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