Title :
Sensitivity Analysis And Inverse Problem Solution Of Electrical Impedance Tomography Using Induced Currents
Author :
Gençer, W.G. ; Ider, Y.Z. ; XuzugIu, M.
Author_Institution :
Middle East Technical University
fDate :
31 Oct-3 Nov 1991
Keywords :
Conductivity; Equations; Image reconstruction; Inverse problems; Magnetic field measurement; Magnetic fields; Sensitivity analysis; Surface impedance; Tomography; Voltage;
Conference_Titel :
Engineering in Medicine and Biology Society, 1991. Vol.13: 1991., Proceedings of the Annual International Conference of the IEEE
Print_ISBN :
0-7803-0216-8
DOI :
10.1109/IEMBS.1991.683814
