DocumentCode :
242036
Title :
Thermal analysis of multiple light sources based on the superposition method
Author :
Dong Shi ; Shiwei Feng ; Yamin Zhang ; Junwei Yang
Author_Institution :
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
fYear :
2014
fDate :
28-31 Oct. 2014
Firstpage :
1
Lastpage :
3
Abstract :
In this paper, the superposition method is used to investigate the complete temperature field of a package with multiple chips and a module with multiple packages, based on the results of transient temperature rise measurements and the thermal resistance coupling matrix. In the case of a package with multiple chips, such as a RGBW LED package with four chips inside, the different power and TSP (temperature sensitive parameter) cause the uneven temperature distribution, while in other case of an array with 16 packages also dose because of separation distance and distribution. It was shown that the thermal resistance coupling matrix can provide relatively accurate and reliable self-heating and coupling temperature rise data.
Keywords :
matrix algebra; semiconductor device packaging; temperature distribution; thermal analysis; RGBW LED package; coupling temperature rise data; multiple light sources; superposition method; temperature sensitive parameter; thermal analysis; thermal resistance coupling matrix; transient temperature rise measurements; uneven temperature distribution; Abstracts; Arrays; Couplings; Lead; Light emitting diodes; Reliability; Thermal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location :
Guilin
Print_ISBN :
978-1-4799-3296-2
Type :
conf
DOI :
10.1109/ICSICT.2014.7021444
Filename :
7021444
Link To Document :
بازگشت