Title :
Fault detection and classification with DNA chips
Author :
Delgado, Alberto
Author_Institution :
Electr. & Electron. Eng. Dept., Nat. Univ. of Colombia, Bogota, Colombia
Abstract :
DNA chips are currently used for gene expression studies of cells and tissues under different conditions. The same principle can be applied in control engineering to supervise industrial plants, determine operating conditions, detect or classify faults using thousands of sampled analog or binary variables.
Keywords :
biocomputing; control engineering computing; fault diagnosis; industrial plants; DNA chips; control engineering; deoxyribonucleic acid; fault classification; fault detection; gene expression studies; industrial plants; operating conditions; sampled analog variables; sampled binary variables;
Conference_Titel :
Intelligent Control. 2003 IEEE International Symposium on
Conference_Location :
Houston, TX, USA
Print_ISBN :
0-7803-7891-1
DOI :
10.1109/ISIC.2003.1254718
