Title :
Design and Fabrication of a Column-type Microthermoelectric Cooler with Bismuth Telluride and Antimony Telluride Pillars by Using Electroplating and MEMS Technology
Author :
Huang, I-Yu ; Li, Ming-Jhan ; Chen, Kuan-Ming ; Zeng, Guo-Yuan ; She, Kun-Dian
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ.
Abstract :
This paper presents an integrated column-type microthermoelectric cooler (mu-TEC) constructed with serial connected p-type Sb2Te3 and n-type Bi2Te3 micro pillars deposited by electrochemical MEMS technology. To optimize the power factor, density and uniformity of the TE films and to enhance the reproducibility of mu-TEC device, a cathode with tunable rotary speed and with accurate current controller has been designed in the electroplating system of this research. The electroplating deposited Bi2Te3 and Sb2Te3 Peltier-elements with an average thickness of 5 mum, are connected using Cr/Au layers at the hot junctions and cold junctions. The measured Seebeck coefficient and electrical resistivity are -52 muV/K and 25.2 muOmega-m or Bi2Te3 layers, and are 71 muV/K and 19.1 Omega;-m for Sb2Te3 films after annealed at 250degC. The optimized power factors of the n-type (1.07 times 10-4 W/K2-m) and p-type (2.64 times 10-4 W/K2-m) telluride compounds have been demonstrated in this paper. Under 5 volts driven, the integrated mu-TEC device shows average cooling achieved is about 0.7 K.
Keywords :
Seebeck effect; antimony compounds; bismuth compounds; chromium alloys; electrical resistivity; electroplating; gold alloys; micromechanical devices; 250 C; Bi2Te3; Cr-Au; Sb2Te3; Seebeck coefficient; antimony telluride pillars; bismuth telluride pillars; cold junctions; column-type microthermoelectric cooler; electrical resistivity; electrochemical MEMS technology; electroplating; hot junctions; micropillars; mu-TEC device; Bismuth; Cathodes; Chromium; Control systems; Design optimization; Fabrication; Micromechanical devices; Reactive power; Reproducibility of results; Tellurium;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
1-4244-0610-2
DOI :
10.1109/NEMS.2007.352126