Title :
Optical Properties and Structure of Copper (II) Phthalocyanine(CuPc) Organic Thin Film Grown by Electron --Beam Evaporation Technique
Author :
Tunhoo, Benchapol ; Nukeaw, Jiti
Author_Institution :
Quantum and Optical Semiconductor Research Laboratory, Nanoelectronics Unit, Department of Applied Physics, Faculty of Science, King Mongkut´´s Institute of Tehnology Ladkrabang, Bangkok, THAILAND. 10520. phone: +66 2 326 4339ext.329; fax: +66 2 326 4354;
Abstract :
Copper (II) phthalocyanine (CuPc) thin films were grown by electron beam evaporation technique with various substrate temperatures. Crystalline of CuPc thin films was investigated by X-ray diffraction (XRD) spectroscopy. Diffraction pattern exhibit high quality crystalline films as monoclinic α-phase structure. Surface morphology of CuPc thin films was characterized by field emission electron microscope (FE-SEM) and the films grown with 150 °C substrate temperature illustrated nanorod-like structure. Absorption spectra were obtained by UV/visible spectroscopy, revealed to Q-band and B-band. The transition energy of CuPc was characterized by photoreflectance spectroscopy (PR) correspond to an absorption peak of Q-band.
Keywords :
X-ray diffraction; copper compounds; field emission electron microscopes; nanotechnology; optical properties; organic compounds; semiconductor thin films; surface morphology; ultraviolet spectroscopy; 150 °C; UV spectroscopy; X-ray diffraction spectroscopy; copper (II) phthalocyanine; electron beam evaporation; field emission electron microscope; nanorod-like structure; nanotechnology; optical properties; organic thin film; photoreflectance spectroscopy; semiconductor films; semiconductor growth; surface morphology; Copper; Crystallization; Electron optics; Optical diffraction; Optical films; Spectroscopy; Substrates; Temperature; Transistors; X-ray diffraction; Nanotechology; Organic Compounds; Semiconductor Growth; Semiconductor films;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
1-4244-0610-2
DOI :
10.1109/NEMS.2007.352130
