DocumentCode
2420638
Title
Alternate solder bump technologies for flip chip applications
Author
Li, Li ; Lin, Jong-Kai
Author_Institution
Semicond. Products Sect., Motorola Inc., Tempe, AZ, USA
fYear
2000
fDate
2000
Firstpage
124
Lastpage
130
Abstract
Flip chip on board technology using eutectic Sn-Pb solder bumps to reduce cost associated with cladded printed circuit board is becoming more common in the industry. However, the, low melting eutectic Sn-Pb bumps are subjected to issues such as solder extrusion during subsequent reflow processes and solder microstructure coarsening after extensive high temperature exposures such as the under-the-hood automotive environment. To address these issues, we have developed a stencil print solder bumping process that is applicable to various alternatives to eutectic Sn63Pb37 solder bump. The process has been demonstrated to solder alloys with melting range between 211°C and 265°C. Many alloys of such melting range have potential to meet temperature hierarchy requirement for flip chip BGA packages. Additionally, some high temperature solders contain no lead, which is good for environment and for reducing soft error rate of memory IC´s. This paper summarized the alternate solder bump technology development, which uses the print solder bump process, the most flexible method to deposit the many bump metallurgies. Solder paste material down selection, process development, bump characterization, and flip chip interconnect reliability results for various alloy bumps are reported. Typical bump height uniformity is 135±3.5 μm, which is equivalent of 3% of bump height standard deviation. In many cases, bump composition is close to the theoretical eutectic composition of selected alloy systems. Preliminary reliability evaluation of direct chip attach packages having high m.p. bumps under-65°C/+150°C air-to-air temperature cycle test are reported
Keywords
ball grid arrays; eutectic alloys; flip-chip devices; lead alloys; reflow soldering; tin alloys; 65 to 150 C; BGA; Sn-Pb; Sn-Pb eutectic alloy; direct chip attach package; flip-chip-on-board technology; interconnect reliability; microstructure coarsening; printed circuit board; reflow process; solder bumping; stencil printing; temperature cycling; Automotive engineering; Costs; Error analysis; Flip chip; Integrated circuit interconnections; Lead; Microstructure; Packaging; Printed circuits; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
Conference_Location
Braselton, GA
Print_ISBN
0-930815-59-9
Type
conf
DOI
10.1109/ISAPM.2000.869255
Filename
869255
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