• DocumentCode
    2420742
  • Title

    Effect of thermal ageing on the shear strength of lead-free solder joints

  • Author

    Oliver, J.R. ; Liu, J. ; Lai, Z.

  • Author_Institution
    Div. of Electron. Production, Chalmers Univ. of Technol., Goteborg, Sweden
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    152
  • Lastpage
    157
  • Abstract
    As a response to the proposed legislation and regulations restricting the use of lead-based solders in the electronics industry, efforts to develop alternative solders have increased dramatically. In this work lead-free solder alloys with compositions of Sn96.5-Ag3.5, Sn96.3-Ag3.2-Cu0.5, Sn93.5-Ag3.5-Bi3 and Sn90-Ag2-Bi7.5-Cu0.5 (wt%) have been used to solder copper “components” to Ni/Au and Sn/Pb metallisations in order to simulate the solder joint in electronics. The shear strength of the soldered joints after thermal ageing at 25°C, 100°C and 150°C for 200 hours, 500 hours and 1000 hours have been evaluated. The fracture surfaces have been studied using scanning electron microscopy with energy dispersive spectroscopy. In general the shear strength decreases as the ageing time increases, however the Sn-Ag systems are shown to be more stable with ageing temperature and time. Bismuth containing alloys are shown to have the highest strength initially but after ageing the strength of the joints become very weak
  • Keywords
    ageing; environmental factors; fracture; scanning electron microscopy; shear strength; soldering; thermal stresses; tin alloys; 100 C; 1000 hour; 150 C; 200 hour; 25 C; 500 hour; Sn-Ag; Sn-Ag-Bi; Sn-Ag-Bi-Cu; Sn-Ag-Cu; ageing time; copper components soldering; energy dispersive spectroscopy; fracture surfaces; lead-free solder joints; scanning electron microscopy; shear strength; thermal ageing effect; Aging; Copper alloys; Electronics industry; Environmentally friendly manufacturing techniques; Gold alloys; Lead; Legislation; Nickel alloys; Soldering; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-59-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2000.869260
  • Filename
    869260