Title :
Flip chip self-alignment mechanism and modeling
Author :
Chen, Ruijun ; Fennell, Brett ; Baldwin, Daniel F.
Author_Institution :
George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The self-alignment motion of the chip bond pads to the corresponding substrate bond pads is critical to the yield and reliability of next generation flip chip technology. Modeling the self-alignment mechanism has been the subject of numerous research programs focusing primarily on the quasistatic equilibrium deformation of molten solder joins. In this paper, a mathematical model of the self-alignment mechanism for low cost, next generation flip chip processes is proposed. The model is structured to handle two cases of misalignment. For small misalignments (e.g., <0.25% of the pitch), the mathematical model is analytically solved based on a linear regressive restoring force model. For large misalignments (e.g., >0.25% of the pitch), the impact of solder wetting on the self-alignment mechanism is analyzed. Following the investigation a new relationship between molten solder restoring force and misalignment was discovered
Keywords :
drag; flip-chip devices; modelling; reflow soldering; surface energy; wetting; chip bond pads; large misalignments; linear regressive restoring force model; mathematical model; molten solder restoring force; next generation flip chip technology; packaging; self-alignment motion; small misalignments; solder wetting; substrate bond pads; viscous drag force; Assembly; Bonding; Costs; Electronics packaging; Flip chip; Laboratories; Mathematical model; Mechanical engineering; Shape; Soldering;
Conference_Titel :
Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
Conference_Location :
Braselton, GA
Print_ISBN :
0-930815-59-9
DOI :
10.1109/ISAPM.2000.869261