DocumentCode
2420779
Title
A new job for the pseudo-MOS transistor: working in the pressure sensors field
Author
Ravariu, C. ; Ravariu, F. ; Rusu, A. ; Dobrescu, D. ; Dobrescu, L. ; Popa, C. ; Chiran, I.
Author_Institution
Fac. of Electron. & Telecommun. 313, Politehnica Univ. of Bucharest, Romania
Volume
1
fYear
2002
fDate
2002
Firstpage
215
Abstract
Recently, pressure sensors that combine SOI structures with the properties of piezoelectric layers have been developed. With a SOI-MOSFET used as a transducer element, the sensor can detect pressures just over a threshold value, corresponding to the inversion onset. In this paper, a pseudo-MOS/SOI transistor is the transducer that enhances the work regime: accumulation or inversion for a SOI-MOSFET like regime and depletion for a J-FET like regime. A PZT layer is used for sensing the pressure. New analytical models for the sensor sensitivity in various regimes are presented. ATLAS simulations, based on the concept of "equivalent gate voltage", verify how does the sensor works and provide the current through the transducer. A strongly non-linear characteristic of the sensor results.
Keywords
MOSFET; Poisson equation; doping profiles; electronic engineering computing; junction gate field effect transistors; piezoelectric transducers; pressure sensors; pressure transducers; semiconductor device models; silicon-on-insulator; J-FET; PZT layers; Poisson equation integration; SOI pseudo-MOS piezoelectric transistors; SOI-MOSFET transducer elements; Si-PZT; Si-PbZrO3TiO3; accumulation region; doping profiles; equivalent gate voltage simulations; inversion onset; inversion region; piezoelectric layers; pressure sensors; pressure threshold value detection; sensor nonlinear characteristics; sensor sensitivity; transducer current; Analytical models; Etching; MOSFET circuits; Mechanical sensors; Piezoelectric films; Piezoelectric transducers; Sensor phenomena and characterization; Substrates; Transistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2002. 9th International Conference on
Print_ISBN
0-7803-7596-3
Type
conf
DOI
10.1109/ICECS.2002.1045372
Filename
1045372
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