• DocumentCode
    2420820
  • Title

    Application of repetitive pulsed power technology to chemical processing

  • Author

    Kaye, R.J. ; Hamil, R.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1995
  • fDate
    5-8 June 1995
  • Firstpage
    268
  • Lastpage
    269
  • Abstract
    Summary form only given. The numerous sites of soil and water contaminated with organic chemicals present an urgent environmental concern that continues to grow. Electron and X-ray irradiation have been shown to be effective methods to destroy a wide spectrum of organic chemicals, nitrates, nitrites, and cyanide in water by breaking molecules to non-toxic products or entirely mineralizing the by-products to gas, water, and salts. Irradiation may also be a cost-effective pre-treatment of compounds resistant to bioremediation. Sandia National Laboratories is developing repetitive high energy pulsed power (RHEPP) technology capable of producing high average power, broad area electron or X-ray beams. The 300 kW RHEPP-II facility accelerates electrons to 2.5 MeV at 25 kA over 1000 cm/sup 2/ in 60 ns pulses at repetition rates of over 100 Hz. Linking this modular treatment capability with our rapid optical-sensing diagnostics and neural network characterization software algorithms will provide a smart waste treatment (SWaT) system. Such a system would also be applicable for chemical manufacture and processing of industrial waste for reuse or disposal. We describe both the RHEPP treatment capability and sensing technologies. Measurements of the propagated RHEPP-II beam and dose profiles are presented. Sensors and rapid detection software are also discussed with application toward chemical treatment.
  • Keywords
    X-ray applications; chemical technology; electron beam applications; neural nets; optical sensors; pulsed power technology; soil; waste disposal; water pollution control; 2.5 MeV; 25 kA; 300 kW; X-ray beams; X-ray irradiation; chemical manufacture; chemical processing; chemical treatment; electron acceleration; electron beams; electron irradiation; industrial waste; modular treatment capability; neural network characterization software algorithms; organic chemicals; rapid detection software; rapid optical-sensing diagnostics; repetitive pulsed power technology; sensing technologies; smart waste treatment system; soil contamination; water contamination; Acceleration; Chemical sensors; Chemical technology; Electron beams; Immune system; Laboratories; Mineralization; Organic chemicals; Soil; Water pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
  • Conference_Location
    Madison, WI, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-2669-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1995.533496
  • Filename
    533496