DocumentCode
2420956
Title
High-resolution cortical dipole layer imaging based on noise covariance matrix
Author
Hori, Junichi ; Watanabe, Satoru
Author_Institution
Dept. of Biocybernetics, Niigata Univ., Niigata, Japan
fYear
2009
fDate
3-6 Sept. 2009
Firstpage
73
Lastpage
76
Abstract
We have investigated the suitable spatial filters for inverse estimation of cortical dipole imaging from the scalp electroencephalogram. The effects of incorporating statistical information of noise into inverse procedures were examined by computer simulations and experimental studies. The parametric projection filter (PPF) was applied to an inhomogeneous three-sphere volume conductor head model. The noise covariance matrix was estimated by applying independent component analysis (ICA) to the scalp potentials. Moreover, the sampling method of the noise information was examined for calculating the noise covariance matrix. The simulation results suggest that the spatial resolution was improved while the effect of noise was suppressed by including the separated noise at the time instant of imaging and by adjusting the number of samples according to the signal to noise ratio.
Keywords
bioelectric potentials; covariance matrices; electroencephalography; independent component analysis; medical signal processing; spatial filters; high-resolution cortical dipole layer imaging; independent component analysis; inhomogeneous three-sphere volume conductor head model; noise covariance matrix; parametric projection filter; sampling method; scalp electroencephalogram; scalp potentials; spatial filters; Action Potentials; Algorithms; Brain; Brain Mapping; Computer Simulation; Diagnosis, Computer-Assisted; Electroencephalography; Evoked Potentials; Humans; Models, Neurological; Multivariate Analysis; Nerve Net; Neural Pathways; Regression Analysis; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location
Minneapolis, MN
ISSN
1557-170X
Print_ISBN
978-1-4244-3296-7
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2009.5334965
Filename
5334965
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