Terahertz active and passive imaging

Author

Grossman, Erich N. ; Gordon, Josh ; Novotny, D. ; Chamberlin, R.

Author_Institution

Phys. Meas. Lab., Nat. Inst. Of Stand. & Technol., Boulder, CO, USA

fYear

2014

fDate

6-11 April 2014

Firstpage

2221

Lastpage

2225

Abstract

We describe the results of bistatic scattering measurements covering 325-650 GHz on a series of well-characterized random rough test surfaces. These have implications for active THz imagers that use coherent sources for illumination. The mean scattered intensity is compared to theoretical predictions based on an integral equation method, and the fluctuations are examined in terms of the theory for fully developed speckle. We also present a preliminary, fully passive image made using a recently developed 650 GHz, InP HEMT low-noise amplifier, and compare it to a very similar passive image made using a cryogenic (4K) hotspot microbolometer.

Keywords

high electron mobility transistors; indium compounds; integral equations; low noise amplifiers; millimetre wave measurement; terahertz wave imaging; HEMT low-noise amplifier; InP; active THz imagers; bistatic scattering measurements; cryogenic hotspot microbolometer; frequency 325 GHz to 650 GHz; integral equation method; mean scattered intensity; random rough test surfaces; temperature 4 K; terahertz active imaging; terahertz passive imaging; Antenna measurements; Imaging; Rough surfaces; Scattering; Speckle; Surface roughness; Surface topography; antenna; imaging; measurement; passive; propagation; submillimeter; terahertz;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation (EuCAP), 2014 8th European Conference on

Conference_Location

The Hague

Type

conf

DOI

10.1109/EuCAP.2014.6902253

Filename

6902253