• DocumentCode
    2421152
  • Title

    Application of phase-change materials in Pentium (R) III and Pentium (R) III XeonTM processor cartridges

  • Author

    Chiu, Chia-Pin ; Solbrekken, Gary L. ; LeBonheur, Vassou ; Xu, Youzhi E.

  • Author_Institution
    Assembly & Technol. Dev., Intel Corp., Chandler, AZ, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    265
  • Lastpage
    270
  • Abstract
    Thermal interface materials (TIM´s) were widely used to reduce thermal resistance between the electronic device and the cooling solution. One typical TLM is the phase-change material (PCM) which melts after the electronic device starts to power up. A survey of commercially available PCMs was performed. Thermal characterization of these PCMs was conducted by using the guarded heater based on ASTM D5470. The characterization results are compared to the suppliers´ data sheets. In addition, the thermal test vehicle with the single edge contact (S.E.C.) cartridge form factor is also used as a screening tool to evaluate the PCMs through the power cycles. A BrN-filled PCM was finally selected as the S.E.C. Cartridge TIM. The impact of the fiber mesh carrier and the tilting of interface layer on the PCM thermal performance is discussed
  • Keywords
    ball grid arrays; environmental testing; flip-chip devices; integrated circuit packaging; microprocessor chips; thermal expansion; thermal resistance; ASTM D5470; BrN-filled PCM; Pentium III Xeon processor cartridges; Pentium III processor; die warpage; environmental tests; fiber mesh carrier; flip chip BGA; guarded heater; interface layer tilting; phase-change materials; power cycles; single edge contact cartridge form factor; thermal characterization; thermal impedance; thermal interface materials; thermal resistance reduction; thermal test vehicle; Delamination; Organic materials; Packaging; Plastics; Temperature sensors; Testing; Thermal conductivity; Thermal expansion; Thermal resistance; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Packaging Materials: Processes, Properties andInterfaces, 2000. Proceedings. International Symposium on
  • Conference_Location
    Braselton, GA
  • Print_ISBN
    0-930815-59-9
  • Type

    conf

  • DOI
    10.1109/ISAPM.2000.869283
  • Filename
    869283