DocumentCode :
2421298
Title :
A Study on Theoretical Nano Forces in AFM Based Nanonmanipulation
Author :
Tian, Xiaojun ; Wang, Yuechao ; Xi, Ning ; Dong, Zaili
Author_Institution :
Robotics Lab., Chinese Acad. of Sci., Shenyang
fYear :
2007
fDate :
16-19 Jan. 2007
Firstpage :
917
Lastpage :
921
Abstract :
As it is important to understand the basic mechanics principle in nanofabrication process, much research has been done about nano mechanics with different tools in different nano enviroments, and various kinds of nano force formula have been proposed. However, as the special case of AFM based nanomanipulation is considered, little about its mechanics principle under the micro probe´s operation is known, such as what kinds of nano forces are the decisive factors and how they work, which are important to perform accurate control in nanomanipulation. To explore this subject, nano forces among tip, substrate and particle are analyzed, and simulation & experiments are performed to verify the rationality of the analysis.
Keywords :
atomic force microscopy; nanotechnology; AFM; atomic force microscope; nanoforce analysis; nanomanipulation; nanomechanics; Analytical models; Atomic force microscopy; Electrostatic analysis; Force control; Laboratories; Nanofabrication; Performance analysis; Probes; Robots; Systems engineering and theory; Nano force analysis; atomic force microscope (AFM); force curve; nanomanipulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location :
Bangkok
Print_ISBN :
1-4244-0610-2
Type :
conf
DOI :
10.1109/NEMS.2007.352168
Filename :
4160471
Link To Document :
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