DocumentCode
2421298
Title
A Study on Theoretical Nano Forces in AFM Based Nanonmanipulation
Author
Tian, Xiaojun ; Wang, Yuechao ; Xi, Ning ; Dong, Zaili
Author_Institution
Robotics Lab., Chinese Acad. of Sci., Shenyang
fYear
2007
fDate
16-19 Jan. 2007
Firstpage
917
Lastpage
921
Abstract
As it is important to understand the basic mechanics principle in nanofabrication process, much research has been done about nano mechanics with different tools in different nano enviroments, and various kinds of nano force formula have been proposed. However, as the special case of AFM based nanomanipulation is considered, little about its mechanics principle under the micro probe´s operation is known, such as what kinds of nano forces are the decisive factors and how they work, which are important to perform accurate control in nanomanipulation. To explore this subject, nano forces among tip, substrate and particle are analyzed, and simulation & experiments are performed to verify the rationality of the analysis.
Keywords
atomic force microscopy; nanotechnology; AFM; atomic force microscope; nanoforce analysis; nanomanipulation; nanomechanics; Analytical models; Atomic force microscopy; Electrostatic analysis; Force control; Laboratories; Nanofabrication; Performance analysis; Probes; Robots; Systems engineering and theory; Nano force analysis; atomic force microscope (AFM); force curve; nanomanipulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
Conference_Location
Bangkok
Print_ISBN
1-4244-0610-2
Type
conf
DOI
10.1109/NEMS.2007.352168
Filename
4160471
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