• DocumentCode
    2421298
  • Title

    A Study on Theoretical Nano Forces in AFM Based Nanonmanipulation

  • Author

    Tian, Xiaojun ; Wang, Yuechao ; Xi, Ning ; Dong, Zaili

  • Author_Institution
    Robotics Lab., Chinese Acad. of Sci., Shenyang
  • fYear
    2007
  • fDate
    16-19 Jan. 2007
  • Firstpage
    917
  • Lastpage
    921
  • Abstract
    As it is important to understand the basic mechanics principle in nanofabrication process, much research has been done about nano mechanics with different tools in different nano enviroments, and various kinds of nano force formula have been proposed. However, as the special case of AFM based nanomanipulation is considered, little about its mechanics principle under the micro probe´s operation is known, such as what kinds of nano forces are the decisive factors and how they work, which are important to perform accurate control in nanomanipulation. To explore this subject, nano forces among tip, substrate and particle are analyzed, and simulation & experiments are performed to verify the rationality of the analysis.
  • Keywords
    atomic force microscopy; nanotechnology; AFM; atomic force microscope; nanoforce analysis; nanomanipulation; nanomechanics; Analytical models; Atomic force microscopy; Electrostatic analysis; Force control; Laboratories; Nanofabrication; Performance analysis; Probes; Robots; Systems engineering and theory; Nano force analysis; atomic force microscope (AFM); force curve; nanomanipulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2007. NEMS '07. 2nd IEEE International Conference on
  • Conference_Location
    Bangkok
  • Print_ISBN
    1-4244-0610-2
  • Type

    conf

  • DOI
    10.1109/NEMS.2007.352168
  • Filename
    4160471