DocumentCode
242141
Title
Research progress on core-shell nanowire FETs
Author
Jin He ; Lining Zhang ; Xiangyu Zhang ; Wen Wu ; Wenping Wang ; Miaomiao Ma ; Yun Ye ; Mansun Chan
Author_Institution
Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
fYear
2014
fDate
28-31 Oct. 2014
Firstpage
1
Lastpage
5
Abstract
Silicon-based nanowire CMOS with the core-shell structure has not only excellent short-channel effect and enhanced conductance capability due to reduced scattering effect and unique low-dimensional structure, but also is compatible with the traditional CMOS processing, thus, it may be the promise one among the bulk MOSFET alternatives to extend CMOS integrated circuit into 10nm generation beyond. The work in the ULTRA group explored the novel structure, transport mechanism, simulation tool and compact modeling, strain effect, energy band engineering, so to develop the core-shell nanowire device physics theory, provide the new simulation tool, build an efficient compact model, and establish new fine process integration technique. The work deliverables will help device scientists and circuit designers deeply understand the potential and function of the silicon-based core-shell nanowire FET application beyond 10nm CMOS integrated circuit, know how to realize the optimized circuit performance from the fine processing technology and design.
Keywords
CMOS integrated circuits; MOSFET; nanoelectronics; nanowires; semiconductor device models; silicon; CMOS integrated circuit; CMOS processing; bulk MOSFET; conductance capability; core-shell nanowire FET; core-shell nanowire device physics theory; core-shell structure; energy band engineering; fine process integration technique; low-dimensional structure; reduced scattering effect; short-channel effect; silicon-based nanowire CMOS; size 10 nm; strain effect; Integrated circuit modeling; MOSFET; Numerical models; Semiconductor device modeling; Silicon; Wave functions; Nanowire; compact modeling; core-shell structure; device physics; new structure; simulation tool;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
Conference_Location
Guilin
Print_ISBN
978-1-4799-3296-2
Type
conf
DOI
10.1109/ICSICT.2014.7021497
Filename
7021497
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