• DocumentCode
    242141
  • Title

    Research progress on core-shell nanowire FETs

  • Author

    Jin He ; Lining Zhang ; Xiangyu Zhang ; Wen Wu ; Wenping Wang ; Miaomiao Ma ; Yun Ye ; Mansun Chan

  • Author_Institution
    Shenzhen SOC Key Lab., Peking Univ., Shenzhen, China
  • fYear
    2014
  • fDate
    28-31 Oct. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Silicon-based nanowire CMOS with the core-shell structure has not only excellent short-channel effect and enhanced conductance capability due to reduced scattering effect and unique low-dimensional structure, but also is compatible with the traditional CMOS processing, thus, it may be the promise one among the bulk MOSFET alternatives to extend CMOS integrated circuit into 10nm generation beyond. The work in the ULTRA group explored the novel structure, transport mechanism, simulation tool and compact modeling, strain effect, energy band engineering, so to develop the core-shell nanowire device physics theory, provide the new simulation tool, build an efficient compact model, and establish new fine process integration technique. The work deliverables will help device scientists and circuit designers deeply understand the potential and function of the silicon-based core-shell nanowire FET application beyond 10nm CMOS integrated circuit, know how to realize the optimized circuit performance from the fine processing technology and design.
  • Keywords
    CMOS integrated circuits; MOSFET; nanoelectronics; nanowires; semiconductor device models; silicon; CMOS integrated circuit; CMOS processing; bulk MOSFET; conductance capability; core-shell nanowire FET; core-shell nanowire device physics theory; core-shell structure; energy band engineering; fine process integration technique; low-dimensional structure; reduced scattering effect; short-channel effect; silicon-based nanowire CMOS; size 10 nm; strain effect; Integrated circuit modeling; MOSFET; Numerical models; Semiconductor device modeling; Silicon; Wave functions; Nanowire; compact modeling; core-shell structure; device physics; new structure; simulation tool;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2014 12th IEEE International Conference on
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4799-3296-2
  • Type

    conf

  • DOI
    10.1109/ICSICT.2014.7021497
  • Filename
    7021497